Off-axis Aberration Estimation in an EUV Microscope Using Natural Speckle

A. Shanker, A. Wojdyla, G. Gunjala, Jonathan Dong, M. Benk, A. Neureuther, K. Goldberg, L. Waller
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引用次数: 2

Abstract

Surface roughness on a flat object causes natural speckle when imaged by an extreme ultraviolet (EUV) microscope under sufficient coherence. Using a phase-to-intensity transfer function theory, direct estimation of aberrations from the spectrum of the speckle intensity is demonstrated for various illumination angles.
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利用自然散斑估计EUV显微镜的离轴像差
在极紫外(EUV)显微镜下,在足够相干的条件下,平面物体表面的粗糙度会产生自然斑点。利用相位到强度的传递函数理论,从散斑强度的光谱直接估计像差证明了不同的照明角度。
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