Fault-based product-line testing: effective sample generation based on feature-diagram mutation

Abstract

Testing every member of a product line individually is often impracticable due to large number of possible product configurations. Thus, feature models are frequently used to generate samples, i.e., subsets of product configurations under test. Besides the extensively studied combinatorial interaction testing (CIT) approach for coverage-driven sample generation, only few approaches exist so far adopting mutation testing to emulate faults in feature models to be detected by a sample. In this paper, we present a mutation-based sampling framework for fault-based product-line testing. We define a comprehensive catalog of atomic mutation operators on the graphical representation of feature models. This way, we are able (1) to also define complex mutation operators emulating more subtle faults, and (2) to classify operators semantically, e.g., to avoid redundant and equivalent mutants. We further introduce similarity-based mutant selection and higher order mutation strategies to reduce testing efforts. Our implementation is based on the graph transformation engine Henshin and is evaluated concerning effectiveness/efficiency trade-offs.