{"title":"Investigation of measurement uncertainties and errors in EMI measurement apparatus","authors":"Jian Song, Yong-xin Guo","doi":"10.1109/APEMC.2015.7175319","DOIUrl":null,"url":null,"abstract":"Several measurement uncertainties and errors associated with EMI measurement apparatus have been investigated in this paper. The standard uncertainties of different resolution bandwidth (RBW) selections and dwell time settings in the test receiver during calibration process are found to be comparably small. The signal synchronization between the signal generator and the test receiver is found to be an important factor in cable path attenuation measurement. The results obtained in this paper provide additional knowledge to the existing test standards used in the industry.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2015.7175319","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Several measurement uncertainties and errors associated with EMI measurement apparatus have been investigated in this paper. The standard uncertainties of different resolution bandwidth (RBW) selections and dwell time settings in the test receiver during calibration process are found to be comparably small. The signal synchronization between the signal generator and the test receiver is found to be an important factor in cable path attenuation measurement. The results obtained in this paper provide additional knowledge to the existing test standards used in the industry.
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