Computational complexity in logic testing

J. Sziray
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引用次数: 1

Abstract

The paper is concerned with analyzing and comparing two exact algorithms from the viewpoint of computational complexity. Both are for calculating fault-detection tests for digital circuits. The first one is the so-called composite justification, and the second is the D-algorithm. The analysis will be performed on combinational logic networks at the gate level. Here single and multiple stuck-at logic faults will be considered. As a result, it is pointed out that the composite justification requires significantly less computational step than the D-algorithm and its modifications. From this fact it has been concluded that possibly no other algorithm is available in this field with fewer computational steps. If it holds, then it follows directly that the test calculation problem is of exponential-time, and so are any other NP-complete problems.
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逻辑测试中的计算复杂性
本文从计算复杂度的角度对两种精确算法进行了分析和比较。两者都用于计算数字电路的故障检测测试。第一个是所谓的复合论证,第二个是d算法。分析将在门级的组合逻辑网络上进行。这里将考虑单个和多个卡在逻辑故障。结果表明,与d -算法及其修正相比,复合论证所需的计算步数明显减少。从这一事实可以得出结论,在这个领域可能没有其他的算法可以用更少的计算步骤。如果成立,则直接得出测试计算问题是指数时间问题,其他np完全问题也是指数时间问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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