Transmission line characterization for high frequency synchronization systems design

Abstract

The characterization of interconnection lines used in the design of high frequency synchronization systems is presented in this paper. The transmission line characterization is carried out from the corresponding S-parameter measurements of two microstrip line test structures designed and fabricated using an Austriamicrosystems 0.35 µm process technology. The microstrip test structures are fabricated with Metal4 conductor and using Metal1 level as a ground plane. The fabrication of test structures with same characteristics but different length (l1 ≠ l2) is indispensable for the parameter extraction procedure. The transmission line characterization obtained from S-parameter data allows taking into account the frequency dependence of the resistance, inductance, and capacitance parameters associated with the interconnection lines under study. In this way an accurate model for global interconnections which is valid for high operation frequencies can be determined.