{"title":"Unsteady thermal behaviour of electronic chips inside FC-72 cooled channel","authors":"H. Bhowmik, K. W. Tou, C. Tso","doi":"10.1109/EPTC.2004.1396674","DOIUrl":null,"url":null,"abstract":"Experimental analysis of transient natural convection heat transfer from a four-in-line chip module that are flush-mounted to one wall of a vertical rectangular channel are performed for the liquid coolant of FC-72. The heat flux ranges from 1 kW/m2 to 6 kW/m 2. The effect of heat fluxes and chip numbers are investigated. The results indicate that the heat transfer coefficient is affected strongly by the number of chips. Correlations are presented for individual chips as well as for overall data in the transient regime. The transient correlation for overall data recommended is Nul = 0.47(Fo)-0.35(Ral)1/4","PeriodicalId":370907,"journal":{"name":"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2004.1396674","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Experimental analysis of transient natural convection heat transfer from a four-in-line chip module that are flush-mounted to one wall of a vertical rectangular channel are performed for the liquid coolant of FC-72. The heat flux ranges from 1 kW/m2 to 6 kW/m 2. The effect of heat fluxes and chip numbers are investigated. The results indicate that the heat transfer coefficient is affected strongly by the number of chips. Correlations are presented for individual chips as well as for overall data in the transient regime. The transient correlation for overall data recommended is Nul = 0.47(Fo)-0.35(Ral)1/4
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