Interferometric Surface Metrology of Magnetic Recording Materials

D. M. Perry
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Abstract

Surface roughness of magnetic recording media has been experimentally and theroetically related to the performance of the media (ref. 1). A computerized three-dimensional interferometer (ref. 2) has become an invaluable aid in the development of current and next generation recording products. Correlations of −0.95 and better are routinely achieved between the measured RMS roughness and magnetic performance measures such as rf output in dB.
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磁记录材料的干涉表面计量
磁性记录介质的表面粗糙度在实验和理论上都与介质的性能有关(参考文献1)。计算机三维干涉仪(参考文献2)已成为开发当前和下一代记录产品的宝贵援助。测量的RMS粗糙度和磁性性能测量(如以dB为单位的rf输出)之间的相关性通常达到- 0.95或更高。
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