Generation of Mixed Broadside and Skewed-Load Diagnostic Test Sets for Transition Faults

Abstract

This paper describes a diagnostic test generation procedure for transition faults that produces mixed test sets consisting of broadside and skewed-load tests. A mix of broadside and skewed-load tests yields improved diagnostic resolution compared with a single test type. The procedure starts from a mixed test set generated for fault detection. It uses two procedures to obtain new tests that are useful for diagnosis starting from existing tests. Both procedures allow the type of a test to be modified (from broadside to skewed-load and from skewed-load to broadside). The first procedure is fault independent. The second procedure targets specific fault pairs. Experimental results show that diagnostic test generation changes the mix of broadside and skewed-load tests in the test set compared with a fault detection test set.