Electrical Impedance Tomography-Based Spatial Reconstruction of Admittivity in a Cylindrical Object

J. Dušek, J. Mikulka
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引用次数: 1

Abstract

The paper discusses experimental measurement, simulation, validation, and reconstruction of complex admittivity, with all of the steps performed by utilizing electrical impedance tomography. After a brief introduction, the main aspects of the research are characterized, including the principle of the forward problem, in which the complete electrode model is embedded; the basics of the inverse problem, comprising an objective function solved with the Gauss-Newton method; and the impact of the objective function’s regularization. The 8-electrode measuring configuration and the simulation environment are described in detail, as they facilitate the reconstruction process. The experiment-related portion of the paper outlines the measured voltages and phases for the homogeneous and inhomogeneous admittivity distribution inside the tomograph. Based on the measurement results, we reconstructed the image of the real and imaginary parts of the admittivity, using the EIDORS library to support the procedure. The obtained components were evaluated and compared with the actual position of the inserted object. The final images show that the determinability of the inhomogeneity position has generally improved through exploiting the real part of the complex admittivity; simultaneously, however, the stability of the imaginary part has visibly decreased.
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基于电阻抗层析成像的圆柱形物体导纳空间重构
本文讨论了复杂导纳的实验测量、模拟、验证和重建,所有的步骤都是利用电阻抗断层成像进行的。在简要介绍后,介绍了研究的主要方面,包括正演问题的原理,其中嵌入了完整的电极模型;反问题的基本原理,包括用高斯-牛顿法求解的目标函数;以及目标函数正则化的影响。详细描述了8电极测量配置和仿真环境,因为它们有助于重建过程。本文的实验部分概述了层析成像仪内均匀和不均匀导纳分布的测量电压和相位。在测量结果的基础上,利用EIDORS库对导纳的实部和虚部图像进行重构。对得到的构件进行评估,并与插入物体的实际位置进行比较。最终图像表明,利用复导纳的实部,总体上提高了非均匀性位置的确定性;然而,与此同时,虚部的稳定性明显下降。
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