Kyohei Shimozato, Yohei Nakamura, Song Bian, Takashi Sato
{"title":"An Electrothermal Compact Model of SiC MOSFETs for Simulating Unclamped Inductive Switching Tests","authors":"Kyohei Shimozato, Yohei Nakamura, Song Bian, Takashi Sato","doi":"10.7567/ssdm.2020.d-9-05","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":344423,"journal":{"name":"Extended Abstracts of the 2020 International Conference on Solid State Devices and Materials","volume":"153 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Extended Abstracts of the 2020 International Conference on Solid State Devices and Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7567/ssdm.2020.d-9-05","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}