Fathi H. Amsaad, Atul Prasad Deb Nath, C. Roychaudhuri, M. Niamat
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引用次数: 8
Abstract
Silicon Physically Unclonable Functions (SPUFs) are delay based PUFs that exploit stochastic manufacturing process variations of Integrated Circuits (ICs) on silicon chips to construct unclonable cryptographic secret keys which are unique for each chip. One variant of SPUFs, named Ring Oscillator (RO) PUFs, is typically used for the authentication of silicon technology devices including FPGA chips. Prior research on the area of ROPUF shows that RO frequencies are affected by spatial systematic process variations and hence the generated responses are not statistically random. In addition to the negative effects of systematic variations on overall ROPUF performance, reduced randomness in the generated responses can lead to major hardware security threats. In this paper, Logarithmic and absolute Diverseness Technique (LDT), a novel security technique based on base-10 logarithm and square root of RO deviations from the global RO mean, is proposed to nullify the effects of spatial systematic variation on the response bits of a unique reconfigurable ROPUF design (r-ROPUF) and improve the reliability of the structure. The proposed technique is implemented on the data obtained from 30 Spartan 3E FPGA chips. IBM-SPSS statistical software is used to demonstrate the transformation of RO frequencies to statistically normal frequencies with high reliability through the implementation of the proposed technique. Additionally, it is shown via MATLAB simulation that the technique nullifies the effects of spatial systematic variation on the average RO frequencies extracted from four different r-ROPUF structures. Finally, the response bits generated from each r-ROPUF structure successfully passed the entire National Institute of Standards and Technology (NIST) statistical tests for randomness and exhibited true randomness and higher reliability comped to earlier techniques.
硅物理不可克隆函数是一种基于延迟的物理不可克隆函数,它利用硅芯片上集成电路(ic)的随机制造工艺变化来构造每个芯片唯一的不可克隆加密密钥。spuf的一种变体,称为环形振荡器(RO) puf,通常用于包括FPGA芯片在内的硅技术设备的认证。先前对ROPUF面积的研究表明,RO频率受空间系统过程变化的影响,因此产生的响应不是统计随机的。除了系统变化对整体ROPUF性能的负面影响外,生成响应中的随机性降低还可能导致主要的硬件安全威胁。为了消除空间系统变化对可重构ROPUF (r-ROPUF)响应位的影响,提高结构的可靠性,提出了一种基于以10为基数的RO偏离全局均值的对数和平方根的对数绝对分散技术(LDT)。该技术在30个Spartan 3E FPGA芯片上获得的数据上实现。利用IBM-SPSS统计软件演示了通过实施所提出的技术将RO频率转换为具有高可靠性的统计正态频率。此外,通过MATLAB仿真表明,该技术消除了空间系统变化对从四种不同r-ROPUF结构中提取的平均RO频率的影响。最后,每个r-ROPUF结构生成的响应位成功地通过了整个美国国家标准与技术研究所(NIST)的随机性统计测试,与早期的技术相比,显示出真正的随机性和更高的可靠性。