{"title":"Broadband analysis and characterization of anisotropic dielectric temperature dependence","authors":"B. Rautio, M. E. El Sabbagh, J. Rautio","doi":"10.1109/ICUWB.2011.6058904","DOIUrl":null,"url":null,"abstract":"A broadband methodology for measurement of uniaxial dielectric anisotropy is described. Previous work is improved with reduced measurement error, enhanced automation, and additional material testing. Additionally, permittivity variation with temperature is explored.","PeriodicalId":143107,"journal":{"name":"2011 IEEE International Conference on Ultra-Wideband (ICUWB)","volume":"4169 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Conference on Ultra-Wideband (ICUWB)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICUWB.2011.6058904","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A broadband methodology for measurement of uniaxial dielectric anisotropy is described. Previous work is improved with reduced measurement error, enhanced automation, and additional material testing. Additionally, permittivity variation with temperature is explored.
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