{"title":"A method for improving high-insertion-loss measurements with a vector network analyzer","authors":"J. Jargon, Dylan F. Williams","doi":"10.1109/ARFTG.2017.8000839","DOIUrl":null,"url":null,"abstract":"We present a method for improving high-insertion-loss measurements with a calibrated vector network analyzer (VNA) requiring only two additional pieces of hardware. By utilizing an amplifier and an attenuator, and measuring wave-parameters rather than scattering-parameters, we are able to increase the dynamic range of our measurements while decreasing uncertainties due to the noise floor of the VNA. We compare the results of our technique to standard methods for insertion-loss values up to 110 dB.","PeriodicalId":282023,"journal":{"name":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 89th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2017.8000839","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
We present a method for improving high-insertion-loss measurements with a calibrated vector network analyzer (VNA) requiring only two additional pieces of hardware. By utilizing an amplifier and an attenuator, and measuring wave-parameters rather than scattering-parameters, we are able to increase the dynamic range of our measurements while decreasing uncertainties due to the noise floor of the VNA. We compare the results of our technique to standard methods for insertion-loss values up to 110 dB.
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