Dao-Hong Yang, Jone F. Chen, Kuo-Ming Wu, J. Shih, Jian-Hsing Lee
{"title":"The direct evidence of substrate potential propagation in a gate-grounded NMOS","authors":"Dao-Hong Yang, Jone F. Chen, Kuo-Ming Wu, J. Shih, Jian-Hsing Lee","doi":"10.1016/j.endend.2010.06.029","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":424132,"journal":{"name":"Journal of End-to-end-testing","volume":"15 12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of End-to-end-testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/j.endend.2010.06.029","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}