Joseph Rosen, Lior Dezialoshinski, Ehud Nahtomi, J. Shamir
{"title":"Digital Approach for Pattern Scale Measurement","authors":"Joseph Rosen, Lior Dezialoshinski, Ehud Nahtomi, J. Shamir","doi":"10.1364/optcomp.1991.me28","DOIUrl":null,"url":null,"abstract":"Pattern size measurement is important for applications such as industrial classification and ranging. Optical systems offer fast and parallel processing of detailed pictures.","PeriodicalId":302010,"journal":{"name":"Optical Computing","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Computing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/optcomp.1991.me28","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Pattern size measurement is important for applications such as industrial classification and ranging. Optical systems offer fast and parallel processing of detailed pictures.
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