{"title":"The automated generation of test cases using an extended domain based reliability model","authors":"Alberto Avritzer, E. Weyuker","doi":"10.1109/IWAST.2009.5069040","DOIUrl":null,"url":null,"abstract":"We present a new approach for the automated generation of test cases to be used for demonstrating the reliability of large industrial mission-critical systems. In this paper we extend earlier work by adding failure tracking and transient Markov chain analysis. Results from the transient Markov chain analysis are used to estimate the software reliability at a given system execution time.","PeriodicalId":401585,"journal":{"name":"2009 ICSE Workshop on Automation of Software Test","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 ICSE Workshop on Automation of Software Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWAST.2009.5069040","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
We present a new approach for the automated generation of test cases to be used for demonstrating the reliability of large industrial mission-critical systems. In this paper we extend earlier work by adding failure tracking and transient Markov chain analysis. Results from the transient Markov chain analysis are used to estimate the software reliability at a given system execution time.