{"title":"Microarchitecture level power and thermal simulation considering temperature dependent leakage model","authors":"W. Liao, Fei Li, Lei He","doi":"10.1145/871506.871560","DOIUrl":null,"url":null,"abstract":"In this paper, we present power models with clock and temperature scaling, and develop a first-of-its-type coupled thermal and power simulation with a temperature-dependent leakage power model at the microarchitecture level. We show that leakage energy and total energy can be different by up to 2.5/spl times/ and 2/spl times/ for temperatures between 90/spl deg/C and 130/spl deg/C, respectively. Given such big energy variations, no power model at the microarchitecture level is accurate without considering temperature dependent leakage models.","PeriodicalId":355883,"journal":{"name":"Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003. ISLPED '03.","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-08-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"58","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003. ISLPED '03.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/871506.871560","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 58
Abstract
In this paper, we present power models with clock and temperature scaling, and develop a first-of-its-type coupled thermal and power simulation with a temperature-dependent leakage power model at the microarchitecture level. We show that leakage energy and total energy can be different by up to 2.5/spl times/ and 2/spl times/ for temperatures between 90/spl deg/C and 130/spl deg/C, respectively. Given such big energy variations, no power model at the microarchitecture level is accurate without considering temperature dependent leakage models.