New Probe Design for Hardware Characterization by ElectroMagnetic Fault Injection

Abstract

ElectroMagnetic Fault Injection requires two main devices, a pulse generator and an electromagnetic (EM) injection probe. To improve security characterizations, inductive probes need to be optimized as regards the pulse waveform and field distribution. The improvement of these parameters leads to greater electromotive forces generated in the integrated circuits, which reinforces the efficiency of the attacks by fault injections. This paper presents a complete model of the electromagnetic field induced at the target surface according to Biot and Savart's law. This work defines the relevant design parameters of the new probes that are used for hardware characterization of the target components. These new probes reduce the voltage fault threshold required to disturb the execution of a program in the target. This paper also presents results related to the optimization of spatial resolution and inductive power at the target circuit surface. Understanding these phenomena then helps to implement countermeasures and best secure the strategies of the key IC components.