Jace Rozsa, Yixin Song, Devon Webb, Naomi Debaene, A. Kerr, Elaura Gustafson, Tabitha Caldwell, Halle V. Murray, D. Austin, S. Chiang, A. Hawkins
{"title":"A Verified Simulation Method for Image Charge Detection with Non-cylindrical Electrodes","authors":"Jace Rozsa, Yixin Song, Devon Webb, Naomi Debaene, A. Kerr, Elaura Gustafson, Tabitha Caldwell, Halle V. Murray, D. Austin, S. Chiang, A. Hawkins","doi":"10.1109/IETC47856.2020.9249166","DOIUrl":null,"url":null,"abstract":"We present a novel and thorough simulation technique to understand image charge generated from charged particles on a printed-circuit-board (PCB) detector. The simulation technique analyzes how different parameters such as the position, velocity, and charge magnitude of a particle affect the image charge and the amplifier output. It also enables the designer to directly import signals into circuit simulation software to analyze the full signal conversion process from the image charge to the amplifier output. A novel measurement setup using a Venturi vacuum system shoots single particles through a PCB detector containing patterned electrodes to verify our simulation.","PeriodicalId":186446,"journal":{"name":"2020 Intermountain Engineering, Technology and Computing (IETC)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Intermountain Engineering, Technology and Computing (IETC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IETC47856.2020.9249166","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We present a novel and thorough simulation technique to understand image charge generated from charged particles on a printed-circuit-board (PCB) detector. The simulation technique analyzes how different parameters such as the position, velocity, and charge magnitude of a particle affect the image charge and the amplifier output. It also enables the designer to directly import signals into circuit simulation software to analyze the full signal conversion process from the image charge to the amplifier output. A novel measurement setup using a Venturi vacuum system shoots single particles through a PCB detector containing patterned electrodes to verify our simulation.