{"title":"Evaluation Method for Circuit Reliability Design of Board-level Electronic Products","authors":"C. Zhang, Fengming Lu, Wenzheng Xu","doi":"10.1109/SDPC.2019.00077","DOIUrl":null,"url":null,"abstract":"In order to quantitatively evaluate the circuit reliability design level of board-level electronic products, based on the four influencing factors of electrical stress derating design, tolerance design, signal/power integrity design and key function circuit design, the circuit reliability design evaluation method for board-level electronic products is proposed and application cases are given Firstly, based on the functional performance requirements and design information of the board-level circuit, the circuit reliability design evaluation criteria are proposed. Then, the evaluation parameters are extracted through simulation, testing, etc., and the reliability design level of the circuit is analyzed, and the quantitative evaluation results are given. Finally, the method is applied in the actual circuit, which proves the feasibility and effectiveness of the method.","PeriodicalId":403595,"journal":{"name":"2019 International Conference on Sensing, Diagnostics, Prognostics, and Control (SDPC)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Sensing, Diagnostics, Prognostics, and Control (SDPC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SDPC.2019.00077","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In order to quantitatively evaluate the circuit reliability design level of board-level electronic products, based on the four influencing factors of electrical stress derating design, tolerance design, signal/power integrity design and key function circuit design, the circuit reliability design evaluation method for board-level electronic products is proposed and application cases are given Firstly, based on the functional performance requirements and design information of the board-level circuit, the circuit reliability design evaluation criteria are proposed. Then, the evaluation parameters are extracted through simulation, testing, etc., and the reliability design level of the circuit is analyzed, and the quantitative evaluation results are given. Finally, the method is applied in the actual circuit, which proves the feasibility and effectiveness of the method.