A high quality factor varactor technology evaluation

R. Debroucke, S. Jan, J. Larchanche, C. Gaquière
{"title":"A high quality factor varactor technology evaluation","authors":"R. Debroucke, S. Jan, J. Larchanche, C. Gaquière","doi":"10.1109/RFIC.2010.5477308","DOIUrl":null,"url":null,"abstract":"Providing a high quality factor scalable varactor in an integrated technology is a wager. How to insure that your device will give the highest quality factor possible? In order to response this questions, we let the bases of a varactor gauge combining electrical performance and geometrical sizes. Giving a targeted capacitance, it could furnish a qualitive idea of the adequacy with technology performance. It could furnish also a indicator for comparison with other devices. As example of varactor gauge application, we present a comparison between two diode varactor devices in two BiCMOS technologies.","PeriodicalId":269027,"journal":{"name":"2010 IEEE Radio Frequency Integrated Circuits Symposium","volume":"159 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Radio Frequency Integrated Circuits Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIC.2010.5477308","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Providing a high quality factor scalable varactor in an integrated technology is a wager. How to insure that your device will give the highest quality factor possible? In order to response this questions, we let the bases of a varactor gauge combining electrical performance and geometrical sizes. Giving a targeted capacitance, it could furnish a qualitive idea of the adequacy with technology performance. It could furnish also a indicator for comparison with other devices. As example of varactor gauge application, we present a comparison between two diode varactor devices in two BiCMOS technologies.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
一种高品质因子变容技术评价
在集成技术中提供高质量因子可扩展变容器是一种赌注。如何确保您的设备将提供最高的质量因素?为了回答这个问题,我们让一个变容管的基础,结合电气性能和几何尺寸。给出目标电容,可以提供技术性能充分性的定性概念。它也可以作为与其他装置比较的指标。作为变容管仪表的应用实例,我们比较了两种BiCMOS技术中两种二极管变容管器件的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A 31-dBm, high ruggedness power amplifier in 65-nm standard CMOS with high-efficiency stacked-cascode stages A 0.13-µm CMOS local oscillator for 60-GHz applications based on push-push characteristic of capacitive degeneration A 1.8 to 2.4-GHz 20mW digital-intensive RF sampling receiver with a noise-canceling bandpass low-noise amplifier in 90nm CMOS Millimeter wave CMOS VCO with a high impedance LC tank A single-chip 2.4GHz double cascode power amplifier with switched programmable feedback biasing under multiple supply voltages in 65nm CMOS for WLAN application
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1