{"title":"Two Models of Digital Forensic Examination","authors":"F. Cohen","doi":"10.1109/SADFE.2009.8","DOIUrl":null,"url":null,"abstract":"This paper examines an existing cost model of digital forensic examination and describes a new model of examination. Alternative approaches to the previous techniques are identified including optimization approaches for determining examination order and alternative evaluation methods for optimization criteria.","PeriodicalId":101922,"journal":{"name":"2009 Fourth International IEEE Workshop on Systematic Approaches to Digital Forensic Engineering","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Fourth International IEEE Workshop on Systematic Approaches to Digital Forensic Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SADFE.2009.8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 26
Abstract
This paper examines an existing cost model of digital forensic examination and describes a new model of examination. Alternative approaches to the previous techniques are identified including optimization approaches for determining examination order and alternative evaluation methods for optimization criteria.
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