Characterization of On-chip Interconnections and Capacitive Coupling Effect on CMOS Operational Amplifier

Yujeong Shim, J. Pak, A. Kim, Joungho Kim
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Abstract

The operational amplifier is one of the most important circuits to compose ADCs, DACs and active filters. Now, there are many papers which deal with noise characters of op amps. Most of them are focused on the input signal noises which flow into circuits without account about noise source. Capacitive coupling is one of the most frequent sources of signal noise. The capacitive coupling is inevitable because of high integration. This paper investigates mechanism of input noises flowing into the op amp and effects of capacitive coupling on the op amp as on-chip interconnection modeling and analytical model of the DC output offset voltage of the OPamp are proposed. Furthermore, the models are verified by experimental measurement.
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CMOS运算放大器片上互连及电容耦合效应的表征
运算放大器是构成adc、dac和有源滤波器的最重要电路之一。目前,研究运放噪声特性的论文很多。它们大多集中在输入信号噪声上,而没有考虑噪声源。电容耦合是信号噪声最常见的来源之一。由于集成度高,电容耦合是不可避免的。本文研究了输入噪声流入运放的机理以及电容耦合对运放的影响,提出了运放直流输出偏置电压的片上互连建模和解析模型。并通过实验验证了模型的正确性。
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