{"title":"Error characterisation for ray-optic based propagation prediction model","authors":"M. Imran, F. Hassan, C. Demetrescu","doi":"10.1109/INMIC.2001.995347","DOIUrl":null,"url":null,"abstract":"This paper presents the error characterisation for a propagation model which models buildings as perfectly conducting or imperfectly conducting, which employs impedance diffraction and reflection coefficients. The error characterisation for a single building scenario and multiple building scenarios is presented.","PeriodicalId":286459,"journal":{"name":"Proceedings. IEEE International Multi Topic Conference, 2001. IEEE INMIC 2001. Technology for the 21st Century.","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-12-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. IEEE International Multi Topic Conference, 2001. IEEE INMIC 2001. Technology for the 21st Century.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INMIC.2001.995347","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents the error characterisation for a propagation model which models buildings as perfectly conducting or imperfectly conducting, which employs impedance diffraction and reflection coefficients. The error characterisation for a single building scenario and multiple building scenarios is presented.
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