Modeling and simulation of magnetron discharges inside a vacuum interrupter as a method to analyze the vacuum status

Kai Hencken, T. Kaufman, D. Gentsch, T. Delachaux
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Abstract

Vacuum Interrupters (VIs) rely strongly on the vacuum level to be below 10-2Pa to be able to operate safely. The vacuum status is normally tested during production to be well below this level (typically below 10-5Pa) and then assumed to be sealed for life (fixed at 30 years). With a larger number of vacuum interrupters now reaching their end of life, there is a renewed interest in assessing their vacuum status in the field. The magnetron gauge principle can be applied for this. The basis for the principle is the formation of an electron trap by electric and magnetic fields across the VI. This article investigates the measurement principle using different modeling and simulation approaches. This allows getting insight into the working principle. Some basic design properties can be understood from the electron orbits. More important is the formation of a closed magnetic trap, which is investigated using an effective potential. More detailed calculations are done using a particle-in-cell approach. This allows the calculation of the build-up of the space charge of the electrons inside the trap, as well as the position and total numbers of electrons trapped. With this, one can determine the proportionality constant between the electrical current measured and the particle density in the VI. A comparison of the outcome of these simulations to own experimental findings and to results found in the literature is finally done.
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对真空灭流器内部磁控管放电进行建模与仿真,分析真空状态
真空断路器(VIs)强烈依赖于低于10-2Pa的真空度才能安全运行。通常在生产过程中对真空状态进行测试,使其远低于该水平(通常低于10-5Pa),然后假定终身密封(固定为30年)。随着越来越多的真空断路器达到使用寿命,人们对评估其在现场的真空状态重新产生了兴趣。磁控管测量原理可用于此。该原理的基础是通过电场和磁场在VI上形成电子陷阱。本文使用不同的建模和仿真方法研究了测量原理。这允许深入了解工作原理。从电子轨道可以理解一些基本的设计性质。更重要的是闭合磁阱的形成,这是用有效电位来研究的。更详细的计算是使用细胞内粒子的方法完成的。这样就可以计算出陷阱中电子的空间电荷的积累,以及被困电子的位置和总数。这样,就可以确定测量的电流和VI中的粒子密度之间的比例常数。最后,将这些模拟的结果与自己的实验结果和文献中的结果进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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