{"title":"Digital Twin Technology: Modeling a Circuit Board for Simulating Electronic Device Operation","authors":"E. Tkacheva, D.A. Makhinya, J. Donetskaya","doi":"10.17586/2687-0568-2021-3-4-52-57","DOIUrl":null,"url":null,"abstract":"We report on possible applications of the digital twin technology. We analyzed digital twin structures of various types considering their parameters in terms of usage. A circuit board model was designed and the device behavior was predicted during its operation at high temperatures close to critical or above critical values. The data obtained allows to optimize the device operation regimes and produce timely adjustments to the design.","PeriodicalId":332408,"journal":{"name":"Reviews on Advanced Materials and Technologies","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Reviews on Advanced Materials and Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.17586/2687-0568-2021-3-4-52-57","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
We report on possible applications of the digital twin technology. We analyzed digital twin structures of various types considering their parameters in terms of usage. A circuit board model was designed and the device behavior was predicted during its operation at high temperatures close to critical or above critical values. The data obtained allows to optimize the device operation regimes and produce timely adjustments to the design.
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