G. Le Fur, F. Cano-Fácila, L. Duchesne, D. Belot, L. Féat, A. Bellion, R. Contreres, K. Elis
{"title":"Comparison of antenna measurement results in disturbed environment using a VHF spherical near field system","authors":"G. Le Fur, F. Cano-Fácila, L. Duchesne, D. Belot, L. Féat, A. Bellion, R. Contreres, K. Elis","doi":"10.1109/CAMA.2014.7003330","DOIUrl":null,"url":null,"abstract":"This paper presents parts of investigations done in a VHF spherical Near-Field system in order to propose appropriate measurement procedure. First is briefly presented the mono-probe near field system and measurement challenges due to low frequencies. Then is presented the Antenna Under Test (AUT), the antenna pattern comparison approach and the measurement configurations. Finally, several measurement results using two scans configurations are compared to reference simulation result in order to find the most appropriate way of measurement suited to the measurement facility for the large wavelength considered.","PeriodicalId":409536,"journal":{"name":"2014 IEEE Conference on Antenna Measurements & Applications (CAMA)","volume":"107 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Conference on Antenna Measurements & Applications (CAMA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CAMA.2014.7003330","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper presents parts of investigations done in a VHF spherical Near-Field system in order to propose appropriate measurement procedure. First is briefly presented the mono-probe near field system and measurement challenges due to low frequencies. Then is presented the Antenna Under Test (AUT), the antenna pattern comparison approach and the measurement configurations. Finally, several measurement results using two scans configurations are compared to reference simulation result in order to find the most appropriate way of measurement suited to the measurement facility for the large wavelength considered.