{"title":"Measurement method for detecting magnetic and dielectric properties of composite materials at microwave frequencies","authors":"Sergey V. Dubrovskiy, K. Gareev","doi":"10.1109/EICONRUSNW.2015.7102223","DOIUrl":null,"url":null,"abstract":"Measurements using the Transmission/Reflection line method involves placing a sample in a section of coaxial line and measuring the two ports complex scattering parameters with a vector network analyzer. For calculation of both the permittivity and permeability Nicholson-Ross-Weir method is used. Computation uncertainties problems on a complex plane are considered. An algorithm of SCPI protocol application for remote control of vector network analyzer Rohde&Schwarz series ZVA using LabVIEW programming environment is provided.","PeriodicalId":268759,"journal":{"name":"2015 IEEE NW Russia Young Researchers in Electrical and Electronic Engineering Conference (EIConRusNW)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2015-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE NW Russia Young Researchers in Electrical and Electronic Engineering Conference (EIConRusNW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EICONRUSNW.2015.7102223","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Measurements using the Transmission/Reflection line method involves placing a sample in a section of coaxial line and measuring the two ports complex scattering parameters with a vector network analyzer. For calculation of both the permittivity and permeability Nicholson-Ross-Weir method is used. Computation uncertainties problems on a complex plane are considered. An algorithm of SCPI protocol application for remote control of vector network analyzer Rohde&Schwarz series ZVA using LabVIEW programming environment is provided.
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