Glass Substrate Inspection Using Swept-Source Optical Coherence Tomography

Seungsu Lee, Seungsoo Hong, Jeongkyun Na, Hansol Kim, Y. Jeong
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引用次数: 1

Abstract

We demonstrate a novel industrial application of optical coherence tomography (OCT) for glass substrate inspection. For high resolution and high speed OCT measurements, we developed an all-fiberized Fourier-domain mode locking swept source with broad bandwidth and high sweeping speed as the light source for the OCT system. With this, we successfully measured multiple layers of glass substrate.
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利用扫描源光学相干层析成像技术检测玻璃基板
我们展示了光学相干层析成像(OCT)用于玻璃基板检测的一种新的工业应用。为了实现高分辨率和高速OCT测量,我们开发了一种具有宽带宽和高扫描速度的全光纤傅里叶域锁模扫描源作为OCT系统的光源。有了这个,我们成功地测量了多层玻璃基板。
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