Seungsu Lee, Seungsoo Hong, Jeongkyun Na, Hansol Kim, Y. Jeong
{"title":"Glass Substrate Inspection Using Swept-Source Optical Coherence Tomography","authors":"Seungsu Lee, Seungsoo Hong, Jeongkyun Na, Hansol Kim, Y. Jeong","doi":"10.1364/FTS.2019.JTH2A.24","DOIUrl":null,"url":null,"abstract":"We demonstrate a novel industrial application of optical coherence tomography (OCT) for glass substrate inspection. For high resolution and high speed OCT measurements, we developed an all-fiberized Fourier-domain mode locking swept source with broad bandwidth and high sweeping speed as the light source for the OCT system. With this, we successfully measured multiple layers of glass substrate.","PeriodicalId":174423,"journal":{"name":"Optical Sensors and Sensing Congress (ES, FTS, HISE, Sensors)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Sensors and Sensing Congress (ES, FTS, HISE, Sensors)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/FTS.2019.JTH2A.24","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We demonstrate a novel industrial application of optical coherence tomography (OCT) for glass substrate inspection. For high resolution and high speed OCT measurements, we developed an all-fiberized Fourier-domain mode locking swept source with broad bandwidth and high sweeping speed as the light source for the OCT system. With this, we successfully measured multiple layers of glass substrate.