Comparison between SRAM SEE cross-sections from ion beam testing with those obtained using a new picosecond pulsed laser facility

R. Jones, A. Chugg, C. Jones, P. H. Duncan, Chris Dyer, C. Sanderson
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引用次数: 39

Abstract

A new pulsed laser facility has been developed to extend laser testing techniques to generate upset cross-section curves. The objective has been to establish an economical laser-based bulk screening capability for SEE susceptibility.
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离子束测试的SRAM SEE横截面与使用新的皮秒脉冲激光设备获得的横截面的比较
研制了一种新型脉冲激光设备,将激光检测技术扩展到产生弯曲截面曲线。目标是建立一种经济的基于激光的SEE敏感性整体筛选能力。
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