{"title":"X-Ray Diffraction Analysis of Strains and Stresses in Thin Films","authors":"A. Segmüller, M. Murakami","doi":"10.1016/B978-0-12-341827-2.50010-8","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":226718,"journal":{"name":"Treatise on Materials Science and Technology","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"39","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Treatise on Materials Science and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/B978-0-12-341827-2.50010-8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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