Precise E-field measurement inside TEM cell at GSM frequencies using microstrip E-field probe

N. Narang, S. Dubey, P. S. Negi, V. N. Ojha
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引用次数: 6

Abstract

A dual-band Electric (E-) field probe of 950MHz and 2.45GHz (bandwidth of 100MHz and 300MHz respectively) based on coplanar waveguide (CPW)-fed microstrip antenna is used to measure the E-field strength inside the transverse electromagnetic (TEM) cell. The paper discusses the design, optimization, fabrication and characterization of the E-field probe. Theoretical, simulated and measured E-field strength has been reported. For validation purpose, the results are compared against theoretical values and standard E-field probe and are found in agreement.
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使用微带电磁场探针在GSM频率下精确测量TEM细胞内的电磁场
采用基于共面波导馈电微带天线的950MHz和2.45GHz双频电场探头(带宽分别为100MHz和300MHz)测量横向电磁(TEM)单元内部的电场强度。本文讨论了电磁场探针的设计、优化、制作和表征。已经报道了理论、模拟和测量的电场强度。为了验证目的,将结果与理论值和标准电场探头进行了比较,结果一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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