An integrated probe for planar near-field only intensity measurements

Abstract

An innovative procedure for phaseless near-field measurements is presented. The squared intensity data received by two co-planar probes simultaneously scanning a planar near-field surface are used to retrieve the near-field phase and subsequently to perform the near-field/far-field transformation. The approach requires reduced scan times and low-cost facilities, when compared with existing phase retrieval techniques. Measurements on a microstrip patch antenna for SAR applications are used as experimental validations of the method.