{"title":"Numerical modeling of long-wavelength vertical-cavity surface-emitting semiconductor lasers. I. Continuous-wave modeling","authors":"A. Tsigopoulos, V. Paschos, P. Salet, J. Jacquet","doi":"10.1117/12.316558","DOIUrl":null,"url":null,"abstract":"Long-wavelength vertical-cavity surface-emitting semiconductor lasers are investigated and heating effects on the light vs. current characteristics of VCSELs are analyzed by thermal-electric, optical, and electronic modeling. The model includes nonuniform current injection, carrier diffusion, stimulated emission, distributed heat sources, and active material band structure calculations. Device parameters such as threshold current, and external quantum efficiency are evaluated. Simulated power vs. current characteristics exhibit the typical thermal roll-over in continuous wave operation. The model is applied to two specific optimized underetched structure designs in order to provide an understanding of the current-funneling mechanism and the thermal limitations of such devices.","PeriodicalId":373160,"journal":{"name":"GR-I International Conference on New Laser Technologies and Applications","volume":"81 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"GR-I International Conference on New Laser Technologies and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.316558","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Long-wavelength vertical-cavity surface-emitting semiconductor lasers are investigated and heating effects on the light vs. current characteristics of VCSELs are analyzed by thermal-electric, optical, and electronic modeling. The model includes nonuniform current injection, carrier diffusion, stimulated emission, distributed heat sources, and active material band structure calculations. Device parameters such as threshold current, and external quantum efficiency are evaluated. Simulated power vs. current characteristics exhibit the typical thermal roll-over in continuous wave operation. The model is applied to two specific optimized underetched structure designs in order to provide an understanding of the current-funneling mechanism and the thermal limitations of such devices.