An Approach for Collection and Analysis of Manufacturing Test Sites Data for Electronic Products

Abstract

Manufacturing industry plays an important role in the development of a country by providing employment to its skilled and semi-skilled workforce. Companies focus on maintaining a good standard of their products which can be achieved through manufacturing test. In order to compete with similar companies, the manufacturing companies need to have an optimized electronic product testing system. Products are tested for manufacturing faults and functionality to maintain quality control which is a continuous process. It can be achieved through a process where manufacturing test data is collected and analyzed. In this paper a LabVIEW based application is presented for collection and analysis of manufacturing test site data. The data collected is for low and mid volume batch-size for a month, where a weekly analysis is normally done. The application provides a standard approach based on graphical analysis to review data trends and provide recommendations to the manufacturing organizations for cost reduction, increased first time yield, training requirements for the operators etc. Initial results obtained using the application show that the proposed approach is efficient and reliable for test site data collection and analysis of variety of products.