An Improved Method of Object Detection Based on Chip

Ji-Xiang Wei, Tongwei Lu, Zhimeng Xin
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Abstract

In spite of methods for object detection based on convolutional neural networks, there's a problem that the information of objects missing in the convolutional progress with an immeasurable proportion. The reason is that while the network downsample in order to further obtain the abstract features, a certain pixel point in the feature map corresponding to more original image area, so there're less content that can be referred to. To handle this problem, an improved object detection method based on YOLOv3 is demonstrated. Our approach is composed of three steps, initial detector, adaptive chip generator, secondary detector. Firstly, figuring out which chips are worth detecting in the image. Secondly, screening the best associations for reduce the number of duplicate detections from these chips. Finally, detection progress will run on each chip and summarize the output. Benefit from it, this method achieves a significant performance especially in medium and large size objects.
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一种改进的基于芯片的目标检测方法
尽管有基于卷积神经网络的目标检测方法,但存在一个问题,即在卷积过程中,目标信息丢失的比例不可测量。其原因是,当网络为了进一步获得抽象特征而下采样时,特征图中的某个像素点对应的原始图像区域较多,因此可供参考的内容较少。针对这一问题,提出了一种改进的基于YOLOv3的目标检测方法。我们的方法由三个步骤组成:初始检测器、自适应芯片发生器、二次检测器。首先,找出图像中哪些芯片值得检测。其次,筛选最佳关联以减少从这些芯片中重复检测的数量。最后,在每个芯片上运行检测进度并总结输出。受益于此,该方法取得了显著的性能,特别是在大中型对象中。
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