{"title":"Comparison of nonlocal means despeckling based on stochastic measures","authors":"R. Grimson, N. S. Morandeira, A. Frery","doi":"10.1109/IGARSS.2015.7326470","DOIUrl":null,"url":null,"abstract":"This work presents the use of stochastic measures of similarities as features with statistical significance for the design of despeckling nonlocal means filters. Assuming that the observations follow a Gamma model with two parameters (mean and number of looks), patches are compared by means of the Kullback-Leibler and Hellinger distances, and by their Shannon entropies. A convolution mask is formed using the p-values of tests that verify if the patches come from the same distribution. The filter performances are assessed using well-known phantoms, three measures of quality, and a Monte Carlo experiment with several factors. The proposed filters are contrasted with the Refined Lee and NL-SAR filters.","PeriodicalId":125717,"journal":{"name":"2015 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IGARSS.2015.7326470","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
This work presents the use of stochastic measures of similarities as features with statistical significance for the design of despeckling nonlocal means filters. Assuming that the observations follow a Gamma model with two parameters (mean and number of looks), patches are compared by means of the Kullback-Leibler and Hellinger distances, and by their Shannon entropies. A convolution mask is formed using the p-values of tests that verify if the patches come from the same distribution. The filter performances are assessed using well-known phantoms, three measures of quality, and a Monte Carlo experiment with several factors. The proposed filters are contrasted with the Refined Lee and NL-SAR filters.
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