Formation of β-SiC on por-Si/mono-Si surface according to stranski - krastanow mechanism

Y. Suchikova, S. Kovachov, I. Bardus, A. Lazarenko, I. Bohdanov
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引用次数: 1

Abstract

We report the synthesis of β-SiC/por-Si/mono-Si heterostructure by a hybrid method, consisting of the electrochemical etching of the single-crystal silicon surface with a subsequent carbidization by a thermal annealing in a methane atmosphere. This method has a number of advantages over the known ones, because it is cheap enough and allows one to form the silicon carbide layers of high- quality. The formed structure was studied by means of SEM, EDX and XRD methods. As a result, the dense β-SiC layer, consisting of an array of the spherical islands with diameters of 2–6 μm, coated with the small pores, was formed on the por-Si/mono-Si surface. The geometric dimensions of the islands were studied by calibrating the sample image in the ImageJ software package. The maximum value of the linear size (diameter) of the island dmax = 5.95 μm and the minimum value dmin = 2.11 μm were found in the studied area. In general, the average diameter of the islands is d = 3.72 μm. The distribution has the left-sided asymmetry, that is, the smaller islets predominate. Roundness (the ratio of the area to the square of the larger axis) R = 0.86. According to the results of EDX analysis, it was found that the synthesized structure surface consists exclusively of the carbon and silicon atoms, indicating the high quality of the formed structures. It was found that the SiC film crystallizes in the cubic phase. The formation of the islands is explained by means of the layer-plus-island growth model according to Stranski-Krastanow mechanism, which is characterized by the formation of the dense wetting layer with the massive island complex on the surface. It should be also noted that the porous SiC layers of island type can, in turn, show the perspective as the buffers with the heteroepitaxy of the silicon substrate materials.
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根据斯特兰斯基-克拉斯塔诺机制在多孔硅/单晶硅表面形成β-碳化硅
我们报道了用杂化方法合成β-SiC/por-Si/单si异质结构,包括对单晶硅表面进行电化学腐蚀,然后在甲烷气氛中进行热退火碳化。这种方法与已知的方法相比有许多优点,因为它足够便宜,并且可以形成高质量的碳化硅层。采用SEM、EDX和XRD等方法对其形成的结构进行了研究。结果表明,在多孔硅/单晶硅表面形成了一层致密的β-SiC层,由一系列直径为2 ~ 6 μm的球形岛屿组成,并包裹有细小的孔隙。在ImageJ软件包中对样本图像进行校正,研究了岛屿的几何尺寸。研究区岛的线尺寸(直径)最大值dmax = 5.95 μm,最小值dmin = 2.11 μm。总的来说,岛屿的平均直径为d = 3.72 μm。分布具有左侧不对称,即较小的岛屿占主导地位。圆度(面积与较大轴的平方之比)R = 0.86。根据EDX分析结果,合成的结构表面完全由碳原子和硅原子组成,表明所形成的结构质量很高。结果表明,SiC薄膜在立方相中结晶。岛的形成采用Stranski-Krastanow机制的层加岛生长模型来解释,其特征是在表面形成密集的湿润层和大量的岛复合体。还应注意的是,岛型多孔碳化硅层反过来可以显示作为硅衬底材料异质外延缓冲的前景。
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