Analysis of system parameters for interferometric imaging spectrometer

Caixun Bai, Jianxin Li, Xin Meng, Yan Shen, R. Zhu
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Abstract

The technology of interferometric imaging spectrometer can detect spatial information and spectral information of targets simultaneously. It has been the research hotpot because of its advantages of high throughput, high spectral resolution, high spatial resolution and so on. In order to obtain the spectral images of scene at different distance, a system of interferometric imaging spectrometer is presented, which consists of two imaging lens, a collimating lens, a Sagnac transverse shearing splitter and a detector. Based on the analysis of the optical paths and structure of spectrometer, system parameters of interferometric imaging spectrometer were researched, especially the ones of the transverse shearing splitter, incident plane width, mirror offset, optical parallelism error, and the clear aperture of the imaging lens and collimating lens . Optimal system parameters were given by discussing the relationship of parameters including transverse shearing splitter, detection distance, imaging lens, collimating lens and detector. Experimental prototype is set up to verify the impact of the error of system parameters on the imaging properties.
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干涉成像光谱仪系统参数分析
干涉成像光谱仪技术可以同时检测目标的空间信息和光谱信息。它具有高通量、高光谱分辨率、高空间分辨率等优点,一直是研究的热点。为了获得不同距离场景的光谱图像,提出了一种干涉成像光谱仪系统,该系统由两个成像透镜、一个准直透镜、一个Sagnac横向剪切分光器和一个检测器组成。在分析干涉成像光谱仪光路和结构的基础上,研究了干涉成像光谱仪的系统参数,特别是横向剪切分光器、入射面宽度、反射镜偏移量、光学平行度误差、成像透镜和准直透镜的清口径等参数。通过讨论横向剪切分离器、探测距离、成像透镜、准直透镜和探测器等参数之间的关系,给出了最优系统参数。建立了实验样机,验证了系统参数误差对成像性能的影响。
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