T. Kishimoto, M. Takai, Y. Ohno, H. Sayama, K. Sonoda, Nishimura Tadashi, A. Kinomura, Y. Horino, K. Fujii
{"title":"Optimization of Buried Well Structures in Dynamic Random Access Memories against Soft Error Using Ion Beam Induced Current","authors":"T. Kishimoto, M. Takai, Y. Ohno, H. Sayama, K. Sonoda, Nishimura Tadashi, A. Kinomura, Y. Horino, K. Fujii","doi":"10.1016/B978-0-444-82334-2.50182-9","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":251043,"journal":{"name":"Ion Beam Modification of Materials","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ion Beam Modification of Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/B978-0-444-82334-2.50182-9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}