{"title":"Transistor Failure Modes in High Power Switching Operation","authors":"J. W. Mathews","doi":"10.1109/TBTR2.1962.4503215","DOIUrl":null,"url":null,"abstract":"It is desirable to use power transistors as switches up to their maximum collector-emitter voltage capability (BVcex). In this type operation, failure phenomena during switch-off have been observed and attributed in the literature to second breakdown, punch through, reach through, pinch off, and various types of energy level effects.","PeriodicalId":136909,"journal":{"name":"Ire Transactions on Broadcast and Television Receivers","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1962-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ire Transactions on Broadcast and Television Receivers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TBTR2.1962.4503215","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
It is desirable to use power transistors as switches up to their maximum collector-emitter voltage capability (BVcex). In this type operation, failure phenomena during switch-off have been observed and attributed in the literature to second breakdown, punch through, reach through, pinch off, and various types of energy level effects.
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