J. Cunningham, D. Beckman, D. Mcelfresh, C. Forrest, D. Cohen, A. Krishnamoorthy
{"title":"Scaling VCSEL reliability up to 250Terabits/s of system bandwidth","authors":"J. Cunningham, D. Beckman, D. Mcelfresh, C. Forrest, D. Cohen, A. Krishnamoorthy","doi":"10.1364/IP.2005.ITHA3","DOIUrl":null,"url":null,"abstract":"We evaluate VCSEL reliability for next-generation High Productivity Computers in which several hundreds of terabits of bandwidth are envisioned. An empirical relationship for VCSEL scaling versus bit rate and aperture is presented in order to explore reliability of VCSEL-based links. Reliability is found to degrade with aperture with a fourth order power law dependence. VSCEL sparing, water-cooling and redundancy though percentage of link failures are analyzed.","PeriodicalId":212240,"journal":{"name":"2005 OSA Topical Meeting on Information Photonics (IP)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 OSA Topical Meeting on Information Photonics (IP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/IP.2005.ITHA3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
We evaluate VCSEL reliability for next-generation High Productivity Computers in which several hundreds of terabits of bandwidth are envisioned. An empirical relationship for VCSEL scaling versus bit rate and aperture is presented in order to explore reliability of VCSEL-based links. Reliability is found to degrade with aperture with a fourth order power law dependence. VSCEL sparing, water-cooling and redundancy though percentage of link failures are analyzed.
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