Sanjay Pant, D. Blaauw, V. Zolotov, S. Sundareswaran, R. Panda
{"title":"A stochastic approach to power grid analysis","authors":"Sanjay Pant, D. Blaauw, V. Zolotov, S. Sundareswaran, R. Panda","doi":"10.1145/996566.996616","DOIUrl":null,"url":null,"abstract":"Power supply integrity analysis is critical in modern high perfor-mance designs. In this paper, we propose a stochastic approach to obtain statistical information about the collective IR and LdI/dt drop in a power supply network. The currents drawn from the power grid by the blocks in a design are modelled as stochastic processes and their statistical information is extracted, including correlation infor-mation between blocks in both space and time. We then propose a method to propagate the statistical parameters of the block currents through the linear model of the power grid to obtain the mean and standard deviation of the voltage drops at any node in the grid. We show that the run time is linear with the length of the current wave-forms allowing for extensive vectors, up to millions of cycles, to be analyzed. We implemented the approach on a number of grids, including a grid from an industrial microprocessor and demonstrate its accuracy and efficiency. The proposed statistical analysis can be use to determine which portions of the grid are most likely to fail as well as to provide information for other analyses, such as statistical timing analysis.","PeriodicalId":115059,"journal":{"name":"Proceedings. 41st Design Automation Conference, 2004.","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"54","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 41st Design Automation Conference, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/996566.996616","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 54
Abstract
Power supply integrity analysis is critical in modern high perfor-mance designs. In this paper, we propose a stochastic approach to obtain statistical information about the collective IR and LdI/dt drop in a power supply network. The currents drawn from the power grid by the blocks in a design are modelled as stochastic processes and their statistical information is extracted, including correlation infor-mation between blocks in both space and time. We then propose a method to propagate the statistical parameters of the block currents through the linear model of the power grid to obtain the mean and standard deviation of the voltage drops at any node in the grid. We show that the run time is linear with the length of the current wave-forms allowing for extensive vectors, up to millions of cycles, to be analyzed. We implemented the approach on a number of grids, including a grid from an industrial microprocessor and demonstrate its accuracy and efficiency. The proposed statistical analysis can be use to determine which portions of the grid are most likely to fail as well as to provide information for other analyses, such as statistical timing analysis.
电源完整性分析对于现代高能效设计至关重要。在本文中,我们提出了一种随机方法,用于获取电源网络中集体 IR 和 LdI/dt 下降的统计信息。我们将设计中各块从电网汲取的电流模拟为随机过程,并提取其统计信息,包括各块之间在空间和时间上的相关信息。然后,我们提出了一种通过电网线性模型传播块电流统计参数的方法,以获得电网中任意节点电压降的平均值和标准偏差。我们证明,运行时间与电流波形的长度呈线性关系,因此可以分析多达数百万个周期的大量矢量。我们在许多电网(包括来自工业微处理器的电网)上实施了该方法,并证明了其准确性和效率。建议的统计分析可用于确定电网的哪些部分最有可能发生故障,并为统计时序分析等其他分析提供信息。