Metrics, techniques and recent developments in mixed-signal testing

G. Roberts
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引用次数: 32

Abstract

This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. We begin by first outlining the role of test in a manufacturing environment, and its impact on product cost and quality. We look at the impact of manufacturing defects on the behavior of digital and analog circuits. Subsequently, we argue that analog circuits require very different test methods than those presently used to test digital circuits. We then describe four common analog test methods and their measurement setups. We also describe how analog testing can be accomplished using digital sampling techniques. Finally, we close this tutorial with a brief description of several developments presently underway on the design of testable mixed-signal circuits.
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混合信号测试的度量、技术和最新发展
本文提供了一个关于混合信号测试的教程。我们的重点是测试混合信号设备的模拟部分,因为数字部分是用通常的方式处理的。我们首先概述了测试在制造环境中的作用,以及它对产品成本和质量的影响。我们着眼于制造缺陷对数字和模拟电路行为的影响。随后,我们认为模拟电路需要与目前用于测试数字电路的测试方法非常不同的测试方法。然后,我们描述了四种常见的模拟测试方法及其测量设置。我们还描述了如何使用数字采样技术来完成模拟测试。最后,我们简要描述了目前正在进行的可测试混合信号电路设计的几个发展,以结束本教程。
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