Jabier Martinez, T. Ziadi, Tegawendé F. Bissyandé, Jacques Klein, Yves Le Traon
{"title":"Bottom-up adoption of software product lines: a generic and extensible approach","authors":"Jabier Martinez, T. Ziadi, Tegawendé F. Bissyandé, Jacques Klein, Yves Le Traon","doi":"10.1145/2791060.2791086","DOIUrl":null,"url":null,"abstract":"Although Software Product Lines are recurrently praised as an efficient paradigm for systematic reuse, practical adoption remains challenging. For bottom-up Software Product Line adoption, where a set of artefact variants already exists, practitioners lack end-to-end support for chaining (1) feature identification, (2) feature location, (3) feature constraints discovery, as well as (4) reengineering approaches. This challenge can be overcome if there exists a set of principles for building a framework to integrate various algorithms and to support different artefact types. In this paper, we propose the principles of such a framework and we provide insights on how it can be extended with adapters, algorithms and visualisations enabling their use in different scenarios. We describe its realization in BUT4Reuse (Bottom--Up Technologies for Reuse) and we assess its generic and extensible properties by implementing a variety of extensions. We further empirically assess the complexity of integration by reproducing case studies from the literature. Finally, we present an experiment where users realize a bottom-up Software Product Line adoption building on the case study of Eclipse variants.","PeriodicalId":339158,"journal":{"name":"Proceedings of the 19th International Conference on Software Product Line","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"102","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 19th International Conference on Software Product Line","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2791060.2791086","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 102
Abstract
Although Software Product Lines are recurrently praised as an efficient paradigm for systematic reuse, practical adoption remains challenging. For bottom-up Software Product Line adoption, where a set of artefact variants already exists, practitioners lack end-to-end support for chaining (1) feature identification, (2) feature location, (3) feature constraints discovery, as well as (4) reengineering approaches. This challenge can be overcome if there exists a set of principles for building a framework to integrate various algorithms and to support different artefact types. In this paper, we propose the principles of such a framework and we provide insights on how it can be extended with adapters, algorithms and visualisations enabling their use in different scenarios. We describe its realization in BUT4Reuse (Bottom--Up Technologies for Reuse) and we assess its generic and extensible properties by implementing a variety of extensions. We further empirically assess the complexity of integration by reproducing case studies from the literature. Finally, we present an experiment where users realize a bottom-up Software Product Line adoption building on the case study of Eclipse variants.