Towards a tool for implementing delay-free ECC in embedded memories

Thierry Bonnoit, M. Nicolaidis, N. Zergainoh
{"title":"Towards a tool for implementing delay-free ECC in embedded memories","authors":"Thierry Bonnoit, M. Nicolaidis, N. Zergainoh","doi":"10.1109/ICCD.2011.6081440","DOIUrl":null,"url":null,"abstract":"The reliability of modern Integrated Circuits is affected by nanometric scaling. In many modern designs embedded memories occupy the largest part of the die and are designed as tight as allowed by the process. So they are more prone to failures than other circuits. Error correcting codes (ECC) are a convenient mean for protecting memories against failures. A major drawback of ECC is the speed penalty induced by the encoding and decoding circuits. In [5], we propose an architecture eliminating ECC delays in both read and write paths. However, this previous work does not describe a generic set of rules enabling inserting the delay-free ECC in any design. In this paper, we present the key points of an algorithm and a related tool automating its implementation.","PeriodicalId":354015,"journal":{"name":"2011 IEEE 29th International Conference on Computer Design (ICCD)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE 29th International Conference on Computer Design (ICCD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.2011.6081440","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The reliability of modern Integrated Circuits is affected by nanometric scaling. In many modern designs embedded memories occupy the largest part of the die and are designed as tight as allowed by the process. So they are more prone to failures than other circuits. Error correcting codes (ECC) are a convenient mean for protecting memories against failures. A major drawback of ECC is the speed penalty induced by the encoding and decoding circuits. In [5], we propose an architecture eliminating ECC delays in both read and write paths. However, this previous work does not describe a generic set of rules enabling inserting the delay-free ECC in any design. In this paper, we present the key points of an algorithm and a related tool automating its implementation.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
在嵌入式存储器中实现无延迟ECC的工具
现代集成电路的可靠性受到纳米尺度的影响。在许多现代设计中,嵌入式存储器占据了模具的最大部分,并且在工艺允许的情况下设计得尽可能紧密。因此,它们比其他电路更容易出现故障。纠错码(ECC)是防止存储器故障的一种方便手段。ECC的一个主要缺点是由编码和解码电路引起的速度损失。在[5]中,我们提出了一种在读和写路径中消除ECC延迟的架构。然而,这之前的工作并没有描述一套通用的规则,允许在任何设计中插入无延迟的ECC。在本文中,我们给出了一个算法的关键点和自动化实现的相关工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Hybrid system level power consumption estimation for FPGA-based MPSoC Modeling and design of a nanoscale memory cell for hardening to a single event with multiple node upset Using stochastic computing to implement digital image processing algorithms Energy-efficient multi-level cell phase-change memory system with data encoding Positive Davio-based synthesis algorithm for reversible logic
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1