Applications of extended depth of focus technology to light microscope systems

Abstract

Previous research has demonstrated the success of using a cubic phase mask in optical systems to perform wavefront coding which, along with digital post-processing can extend the depth of focus of standard optical imaging systems [1, 2]. Experimental images have demonstrated an increase of six to eight times the depth of focus of standard systems when using the extended depth of focus technology. This technology is now being extended to high magnification or light microscope systems. Several challenges have arisen due to the special nature of light microscope systems but extended depth of focus (EDF) technology is still found to be useful in such systems.