{"title":"Biaxial anisotropic sample design and rectangular to square waveguide material characterization system","authors":"A. Knisely, M. Havrilla, P. Collins","doi":"10.1109/METAMATERIALS.2015.7342445","DOIUrl":null,"url":null,"abstract":"An electrically biaxial anisotropic sample design methodology utilizing crystal-lographic symmetry is discussed. Sample synthesis equations based on equivalent capacitance analysis translate desired permittivity values and host materials to sample cell dimensions and are subsequently fabricated on a 3-D printer. Equivalent capacitance predictions yield permittivity tensor element values comparable to simulation results. A rectangular to square waveguide measurement system is also used to verify the sample design methodology.","PeriodicalId":143626,"journal":{"name":"2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS)","volume":"126 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/METAMATERIALS.2015.7342445","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
An electrically biaxial anisotropic sample design methodology utilizing crystal-lographic symmetry is discussed. Sample synthesis equations based on equivalent capacitance analysis translate desired permittivity values and host materials to sample cell dimensions and are subsequently fabricated on a 3-D printer. Equivalent capacitance predictions yield permittivity tensor element values comparable to simulation results. A rectangular to square waveguide measurement system is also used to verify the sample design methodology.