{"title":"In situ FESEM observation/EBSD analysis of creep crack propagation in submicron gold films","authors":"H. Inoue, T. Kondo, H. Hirakata, K. Minoshima","doi":"10.1299/jsmekansai.2019.94.201","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":432236,"journal":{"name":"The Proceedings of Conference of Kansai Branch","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Proceedings of Conference of Kansai Branch","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1299/jsmekansai.2019.94.201","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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