Nonlinear HTS lumped elements in microwave transmission and resonance circuits

A. Kalenyuk, A. I. Rebikov, A. Kasatkin, V. Pan
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引用次数: 4

Abstract

Certainly, the dip emergence in the resonator with NLE and the decay emergence in the line with NLE are of the same nature. One can see a full analogy between IL(Pin) dependence for the line and ILdip(Pin) dependence for the resonator with NLE (ILdip - insertion losses in the dip of AFC dependence). The rapid initial decrease in the dip on AFC dependence for resonators with NLE corresponds to the first step on the IL(Pin) dependence, obtained for the lines with NLE. Our measurements have revealed the linear dependencies ILdip(Pin)∼Pin and IL(Pin)∼Pin for resonators and lines, correspondingly (Pin is measured in dbm). The rapid increase of the dip on resonator AFC curves, as well as the rapid increase of the line decay with the input power increase, can be explained by a rapid increase of the NLE surface resistance, caused by its transition from superconducting to the normal state. The heat origin of these effects is supported by observations of hysteretic behavior of the IL(Pin) dependence, measured in the line with NLE. Coincidence of the critical current density values, obtained from microwave and dc transport measurements, indicate that penetration of microwave induced Abrikosov vortices is responsible for the YBCO film heating and its subsequent transition to the normal state, contrary to the suggested model of Josephson weak links [8]. Calculations, performed in the work [5], show that the NLE transition to the normal state proceeds not abruptly, but through formation of resistive domains, causing strong rise of the line decay, when the input power slightly increases.
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微波传输和谐振电路中的非线性高温超导集总元件
当然,具有NLE的谐振腔中的倾角涌现和与NLE直线上的衰减涌现具有相同的性质。我们可以看到线路的IL(引脚)依赖性和具有NLE的谐振器的ILdip(引脚)依赖性之间的完全类比(ILdip - AFC依赖性的倾角中的插入损耗)。具有NLE的谐振器的AFC依赖性下降的快速初始下降对应于具有NLE的线路的IL(引脚)依赖性的第一步。我们的测量结果显示了谐振器和线路的线性相关性ILdip(Pin) ~ Pin和IL(Pin) ~ Pin (Pin以dbm为单位测量)。随着输入功率的增加,谐振腔AFC曲线上的倾角迅速增加,线衰减也迅速增加,这可以解释为NLE表面电阻的迅速增加,这是由于其从超导状态过渡到正常状态造成的。这些效应的热起源是由观察到的IL(Pin)依赖的滞后行为支持的,在与NLE的直线上测量。从微波和直流输运测量中获得的临界电流密度值的重合表明,微波诱导的Abrikosov涡的穿透是YBCO膜加热并随后转变为正常状态的原因,这与Josephson弱链接模型[8]相反。在工作[5]中进行的计算表明,当输入功率略有增加时,NLE向正常状态的转变不是突然进行的,而是通过形成电阻畴,引起线衰减的强烈上升。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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